Technical Papers

  • Crystalline silicon thin foils: Where crystalline quality meets thin-film processing

    Crystalline silicon thin foils: Where crystalline quality meets thin-film processing

    Photovoltaics International 15th Edition
    Frederic Dross, Jef Poortmans

    Today, crystalline-Si photovoltaics (PV) dominate the market, accounting for more than 85% of market share in 2010. A large scientific community made up of academic as well as industrial stakeholders strives to find solutions to improve device efficiencies and to drive down costs. One of the important cost elements of a module is the c-Si wafer itself. This paper discusses the fabrication of a carpet of c-Si foils on glass, either by layer transfer of an epitaxially-grown layer or by bonding of a very thin wafer, and processing this c-Si thin-foil device into a photovoltaic module. This could constitute an advantageous meet-in-the-middle strategy that benefits not only from c-Si material quality but also from thin-film processing developments.

  • Si nanorod-based thin-film solar cells on glass

    Si nanorod-based thin-film solar cells on glass

    Photovoltaics International 15th Edition
    Silke Christiansen, Michael Kiometzis

    Advances in nanofabrication for enhancing the efficiency of optical devices, such as solar cells and photo-detectors, via nanostructuring have attracted a great deal of interest. A photoconversion strategy employing nanorods (NRs) has emerged as a powerful way of overcoming the limitations of planar wafer-based or thin-film solar cells. But there is also a broad spectrum of challenges to be tackled when it comes to putting into practice cost-effective NR solar cell concepts. ROD-SOL is a 10-partner, ‘nanotechnology for energy’ project with end-users, equipment manufacturers and institutes from six countries forming the consortium. The aim of the project is to provide the photovoltaic market with a highly efficient (> 10%), potentially low-cost, thin-film solar cell concept on glass, based on silicon nanorods. This paper presents the project’s achievements and discusses what the future might hold for nanotech-based solar energy production.

  • Cz-Si wafers in solar cell production: Efficiency-limiting defects and material quality control

    Cz-Si wafers in solar cell production: Efficiency-limiting defects and material quality control

    Photovoltaics International 15th Edition
    Jonas Haunschild, Juliane Broisch, Isolde E. Reis, Stefan Rein

    Most high-efficiency solar cells are fabricated from monocrystalline Czochralski silicon (Cz-Si) wafers because the material quality is higher than multicrystalline silicon (mc-Si) wafers. However, the material study presented in this paper reveals strong variations in the material quality of commercially available Cz-Si wafers, leading to a loss in solar cell efficiency of 4% absolute. The reason for this is the presence of defects, which appear as dark rings in photoluminescence (PL) images of the finished solar cells. It is shown that these efficiency-limiting defects originate from oxygen precipitation during emitter diffusion. It is demonstrated that an incoming inspection in the as-cut state is difficult, as strong ring structures in as-cut wafers turn out to originate most often from thermal donors. These are dissolved during high-temperature treatments and are therefore harmless, whereas moderate ring structures in the as-cut state may become severe. That is why critical wafers can be identified and sorted out reliably only after emitter diffusion, by using QSSPC-based lifetime measurements or PL imaging. The two-year statistics gathered from the research line at Fraunhofer ISE on the occurrence of ring defects in Cz-Si wafers indicate that ring defects are highly relevant in terms of material yield.

  • Non-destructive techniques for quality control of photovoltaic modules

    Non-destructive techniques for quality control of photovoltaic modules

    Photovoltaics International 15th Edition
    Shokufeh Zamini, Rita Ebner, Gusztáv Újvári, Bernhard Kubicek

    Non-destructive methods for measuring photovoltaic modules are discussed in this paper, with the aim of comparing different quality-assurance methods for different module technologies (e.g. crystalline and thin-film technologies: a-Si, CdTe, CIS). For a complete quality control of PV modules, a combination of fast and non-destructive methods was investigated. In particular, camera-based measurements, such as electroluminescence (EL) and infrared (IR) technologies, offer excellent possibilities for determining production failures or defects in solar modules, which cannot be detected by means of standard power measurements. These methods are applied effectively in quality control and development support, and EL is already an important characterization tool in industry and research. Most short circuits reduce the voltage in their surrounding area and appear dark in EL images. However, as this failure is not always critical and apparent, short circuits are only precisely identifiable in combination with IR measurements. Therefore, to quickly detect at high resolution the most common defects in a PV module, a combination of EL and IR measurements is advisable.

  • US environmental permitting for PV manufacturing facilities – requirements & strategies for success

    US environmental permitting for PV manufacturing facilities – requirements & strategies for success

    Photovoltaics International 15th Edition
    John Browning

    As a relative newcomer to the industrial world compared to more mature manufacturing sectors, the PV industry has not yet been subject to consistent environmental regulatory standards internationally. Like all industries that have preceded it, PV manufacturing is seeing its regulatory future evolve as PV producers migrate to different regions of the world. With this global expansion come significantly different levels of regulatory stringency, reflective of local conditions and cultures.

  • Industrial n-type solar cells: Towards 20% efficiency

    Industrial n-type solar cells: Towards 20% efficiency

    Photovoltaics International 15th Edition
    Ingrid Romijn, Ard Vlooswijk

    This paper presents examples of recent process developments at ECN in silicon solar cells on n-type monocrystalline base material. For all PV manufacturers, the challenge is to increase module efficiencies while maintaining low production cost. An effective way to move to higher and more stable efficiencies, using low-cost industrial-type processing, is n-type solar cell technology. The solar cell considered in this paper is the n-pasha cell – a bifacial solar cell with homogeneous diffusions and screen-printed metallization. The n-pasha cell is currently produced on an industrial scale by Yingli Solar; in 2011 a maximum solar cell conversion efficiency of 19.97% was obtained using this cell concept on 239cm2 n-type Cz at the ECN laboratory. The focus of the paper will be increasing efficiency by optimization of the cell process, in particular the front-side metallization, and by improvements to the rear-surface passivation. These two steps have contributed an increase in efficiency of 0.8%, allowing cell efficiencies of 20% to be reached.

  • Harmonized procedures for long-term energy yield measurements and performance evaluation

    Harmonized procedures for long-term energy yield measurements and performance evaluation

    Photovoltaics International 15th Edition
    Vincent Helmbrecht, Diana Craciun, Abraham Ellis, Jennifer Granata, Stathis Tselepis, Anastasios Kyritsis, Nikos Hatziargyriou

    As yet, procedures for long-term tests of photovoltaic modules in outdoor conditions have not been considered by international standardization committees. Although many laboratories perform long-term PV outdoor tests, a commonly agreed and standardized procedure has so far not been adopted. The European Distributed Energy Resources Laboratories’ (DERlab) approach to filling the gap of international standardization has led to the development of a basic protocol that complies with European and international standards, while providing specific common guidelines and procedures for measuring the energy yield of PV modules for at least one year in outdoor conditions. The DERlab procedures for long-term PV module testing are described in this paper, and the range of analyses that can be derived from the data, such as module degradation, are discussed. The paper also presents the DERlab approach to measuring module performance in outdoor conditions, which can be used to complement energy-rating methods suggested in international standards. DERlab has created consistent measuring procedures that allow the direct comparison of the energy yield of solar modules taking into account the site-specific factors of different locations and varying climatic conditions, as well as a maintenance guideline.

  • Si nanorod-based thin-film solar cells on glass

    Si nanorod-based thin-film solar cells on glass

    Photovoltaics International 15th Edition
    Silke Christiansen, Michael Kiometzis

    Advances in nanofabrication for enhancing the efficiency of optical devices, such as solar cells and photo-detectors, via nanostructuring have attracted a great deal of interest. A photoconversion strategy employing nanorods (NRs) has emerged as a powerful way of overcoming the limitations of planar wafer-based or thin-film solar cells. But there is also a broad spectrum of challenges to be tackled when it comes to putting into practice cost-effective NR solar cell concepts. ROD-SOL is a 10-partner, ‘nanotechnology for energy’ project with end-users, equipment manufacturers and institutes from six countries forming the consortium. The aim of the project is to provide the photovoltaic market with a highly efficient (> 10%), potentially low-cost, thin-film solar cell concept on glass, based on silicon nanorods. This paper presents the project’s achievements and discusses what the future might hold for nanotech-based solar energy production.

  • TCAD for PV: A fast method for accurately modelling metal impurity evolution during solar cell proce

    TCAD for PV: A fast method for accurately modelling metal impurity evolution during solar cell proce

    Photovoltaics International 15th Edition
    Douglas M. Powell , David P. Fenning, Jasmin Hofstetter, Jean-François Lelièvre, Carlos del Cañizo, Tonio Buonassisi

    Coupled device and process simulation tools, collectively known as technology computer-aided design (TCAD), have been used in the integrated circuit industry for over 30 years. These tools allow researchers to quickly home in on optimized device designs and manufacturing processes with minimal experimental expenditures.

    The PV industry has been slower to adopt these tools, but is quickly developing competency in using them. This paper introduces a predictive defect engineering paradigm and simulation tool, while demonstrating its effectiveness at increasing the performance and throughput of current industrial processes. The impurity-to-efficiency (I2E) simulator is a coupled process and device simulation tool that links wafer material purity, processing parameters and cell design to device performance. The tool has been validated with experimental data and used successfully with partners in industry. The simulator has also been deployed in a free web-accessible applet, which is available for use by the industrial and academic communities.

  • Studying the lifetime of crystalline PV modules by interpreting the acceleration test data with stat

    Studying the lifetime of crystalline PV modules by interpreting the acceleration test data with stat

    Photovoltaics International 15th Edition
    prakashsuratkar, Keshav Prasad, Dr. S. Saravanan, Sreenivas Murty Dasari, K. V. Nagaraj

    Crystalline silicon solar modules installed in the field are exposed to atmospheric conditions and experience stress, which induces a wear-out phenomenon in various parts of the modules and degrades performance over time. The performance eventually reaches a point where the output power falls below an acceptable level. Thermal cycling (TC) and damp heat (DH) are two important reliability tests for estimating infant failures related to materials and the manufacturing process, as well as providing the information on performance degradation with respect to time. In this study, modules composed of 156mm × 156mm multicrystalline silicon cells were subjected to TC and DH tests. By applying acceleration models, such as the Norris-Landzberg model for TC and the Hallberg-Peck model for DH, the minimum guaranteed life was calculated. The electrical and reliability results were interpreted and explained on the basis of the respective models.